
Solutions
Constant Temperature Test
Temperature & Humidity Test
Degrees of Protection (IP Code)
Thermal Shock Test
Altitude Test
Solderability Test
Adhesion Test
Colour Assessment Test
ESD Analysis (RTG & Walking Test)
Non-Destructive Test
Destructive Test
Supply of Environmental Chamber
Preventive Maintenance Services
Material Sorting Activities
Chamber Repair Services
Charged Device Model (CDM)
Charged Device Model (CDM) electrostatic discharge is a common cause of microelectronic circuit failure. Sensitive devices can be seriously damaged or destroyed by a CDM discharge at relatively low voltage. This often occurs when the static charged device contacts a metal surface at a different potential. Such an electrostatic discharge often has an extremely fast rise time.