RFAL TECHNOLOGY PRIVATE LIMITED (INDIA)

Cross-Section Analysis

Cross-sectional analysis involves creating a polished surface on a device or material and examining it under a microscope, using optical and/or SEM microscopy or EDX microanalysis. Metallographic analysis typically involves cross-sectional polishing and may incorporate chemical or electrochemical etching to observe metallographic structures. Additionally, XPS or XRF analysis may be used to examine specific areas on a polished cross-section.

The process of cross sectioning normally involves few steps as below:

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