Heat Generation in Electronics:

All electronic devices generate heat due to the operation of millions of transistors switching on and off rapidly, consuming significant power. While some heat is normal, certain defects can increase power consumption, resulting in excess heat output.

Using Heat to Detect Defects:

This additional heat, though not a primary concern for design engineers, can be leveraged through thermal emission microscopy to detect slight temperature differences. These differences provide valuable data, allowing failure analysts to pinpoint defects and identify their root causes.